LU69582A1 - - Google Patents

Info

Publication number
LU69582A1
LU69582A1 LU69582A LU69582A LU69582A1 LU 69582 A1 LU69582 A1 LU 69582A1 LU 69582 A LU69582 A LU 69582A LU 69582 A LU69582 A LU 69582A LU 69582 A1 LU69582 A1 LU 69582A1
Authority
LU
Luxembourg
Application number
LU69582A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of LU69582A1 publication Critical patent/LU69582A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
LU69582A 1973-03-09 1974-03-07 LU69582A1 (en])

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2311903A DE2311903A1 (de) 1973-03-09 1973-03-09 Verfahren und einrichtung zur ortung von kurzschluessen in mehrlagenverdrahtungen

Publications (1)

Publication Number Publication Date
LU69582A1 true LU69582A1 (en]) 1974-07-05

Family

ID=5874356

Family Applications (1)

Application Number Title Priority Date Filing Date
LU69582A LU69582A1 (en]) 1973-03-09 1974-03-07

Country Status (10)

Country Link
US (1) US3992663A (en])
JP (1) JPS50369A (en])
BE (1) BE812056A (en])
CH (1) CH563587A5 (en])
DE (1) DE2311903A1 (en])
FR (1) FR2220796B1 (en])
GB (1) GB1419354A (en])
IT (1) IT1003688B (en])
LU (1) LU69582A1 (en])
NL (1) NL7402904A (en])

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4074188A (en) * 1975-08-01 1978-02-14 Testline Instruments, Inc. Low impedance fault detection system and method
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems
JPS56156775U (en]) * 1980-04-24 1981-11-21
JPS56160623U (en]) * 1980-04-28 1981-11-30
US4362987A (en) * 1980-09-12 1982-12-07 Huntron Instruments, Inc. Apparatus for detecting electrical shorts in electronic circuits
US4471298A (en) * 1981-12-11 1984-09-11 Cirdyne, Inc. Apparatus for automatically electrically testing printed circuit boards
JPS58178423A (ja) * 1982-04-14 1983-10-19 Nissan Motor Co Ltd 変速機操作レバ−の支持構造
DE3327446C2 (de) * 1983-07-29 1986-07-31 Siemens AG, 1000 Berlin und 8000 München Meßverfahren zur Fehlerortung in Logikschaltungen und Schaltungsanordnung eines Prüfsenders zur Durchführung dieses Verfahrens
GB2166248B (en) * 1984-10-30 1988-01-20 British Gas Corp Detecting resistance faults
JPS6281068U (en]) * 1985-11-08 1987-05-23
EP0252301A1 (de) * 1986-06-30 1988-01-13 Siemens Aktiengesellschaft Verfahren zum Lokalisieren von fehlerhaften Verbindungen zwischen Leiterbahnen und/oder Spannungsebenen von Mehrlagenleiterplatten
JPH0262975A (ja) * 1988-08-30 1990-03-02 Seikosha Co Ltd プリント基板の検査方法およびその検査装置
JPH0474972A (ja) * 1990-07-16 1992-03-10 Kyodo Denki Kenkyusho:Kk プリント配線基板の光学的検査方法及びその装置
US5073754A (en) * 1990-07-24 1991-12-17 Photon Dynamics, Inc. Method and apparatus for testing LCD panel array using a magnetic field sensor
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
US5175504A (en) * 1991-06-17 1992-12-29 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing a simple matrix circuit panel
JPH05196681A (ja) * 1991-06-26 1993-08-06 Digital Equip Corp <Dec> 連続移動する電気回路の相互接続試験方法及び装置
US5432461A (en) * 1991-06-28 1995-07-11 Photon Dynamics, Inc. Method of testing active matrix liquid crystal display substrates
JPH0526944A (ja) * 1991-07-24 1993-02-05 Nippon Sheet Glass Co Ltd 導電パターンの検査装置
US5465052A (en) * 1991-09-10 1995-11-07 Photon Dynamics, Inc. Method of testing liquid crystal display substrates
US5459409A (en) * 1991-09-10 1995-10-17 Photon Dynamics, Inc. Testing device for liquid crystal display base plate
US5406213A (en) * 1991-09-10 1995-04-11 Photon Dynamics, Inc. Instrument for testing liquid crystal display base plates
US5444385A (en) * 1991-09-10 1995-08-22 Photon Dynamics, Inc. Testing apparatus for liquid crystal display substrates
US5504438A (en) * 1991-09-10 1996-04-02 Photon Dynamics, Inc. Testing method for imaging defects in a liquid crystal display substrate
US5543729A (en) * 1991-09-10 1996-08-06 Photon Dynamics, Inc. Testing apparatus and connector for liquid crystal display substrates
GB9212646D0 (en) * 1992-06-15 1992-07-29 Marconi Instruments Ltd A method of and equipment for testing the electrical conductivity of a connection
US5485080A (en) * 1993-09-08 1996-01-16 The United States Of America As Represented By The Secretary Of Commerce Non-contact measurement of linewidths of conductors in semiconductor device structures
WO1995007469A1 (en) * 1993-09-08 1995-03-16 THE UNITED STATES OF AMERICA, represented by THE SECRETARY, DEPARTMENT OF COMMERCE Non-contact linewidth measurement of semiconductor conductors
US6028434A (en) * 1994-11-28 2000-02-22 Lockheed Fort Worth Company Method and apparatus for detecting emitted radiation from interrupted electrons
DE19541307C2 (de) * 1995-11-06 2001-09-27 Atg Test Systems Gmbh Verfahren zum Prüfen von elektrischen Leiteranordnungen und Vorrichtung zum Ausführen des Verfahrens
US6118284A (en) * 1996-10-04 2000-09-12 Ghoshal; Uttam S. High speed magnetic flux sampling
US5821759A (en) * 1997-02-27 1998-10-13 International Business Machines Corporation Method and apparatus for detecting shorts in a multi-layer electronic package
EP0863611B1 (en) * 1997-03-04 2003-08-06 STMicroelectronics S.r.l. A short-circuit detecting device
US6107806A (en) 1997-07-30 2000-08-22 Candescent Technologies Corporation Device for magnetically sensing current in plate structure
JP2001512239A (ja) * 1997-07-30 2001-08-21 キャンデセント・テクノロジーズ・コーポレイション プレート構造体における磁流の検出及び短絡不良箇所の検出
US6118279A (en) 1997-07-30 2000-09-12 Candescent Technologies Corporation Magnetic detection of short circuit defects in plate structure
JP3285568B2 (ja) * 1999-05-24 2002-05-27 日本電産リード株式会社 基板の配線検査装置および配線検査方法
JP2003035738A (ja) * 2001-07-19 2003-02-07 Omron Corp 部品実装基板の検査方法および部品実装基板用の検査装置
US7028654B2 (en) 2002-10-18 2006-04-18 The Maclean-Fogg Company Metering socket
US6871622B2 (en) 2002-10-18 2005-03-29 Maclean-Fogg Company Leakdown plunger
US7273026B2 (en) 2002-10-18 2007-09-25 Maclean-Fogg Company Roller follower body
US7191745B2 (en) 2002-10-18 2007-03-20 Maclean-Fogg Company Valve operating assembly
US7128034B2 (en) 2002-10-18 2006-10-31 Maclean-Fogg Company Valve lifter body
US7355417B1 (en) * 2005-09-20 2008-04-08 Emc Corporation Techniques for obtaining electromagnetic data from a circuit board
US8106666B2 (en) * 2009-03-12 2012-01-31 International Business Macines Corporation Testing an electrical component
US9523729B2 (en) * 2013-09-13 2016-12-20 Infineon Technologies Ag Apparatus and method for testing electric conductors

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3247453A (en) * 1961-03-09 1966-04-19 Api Instr Company Magnetic flaw detector with exciting and sensing coils axially aligned on opposite sides of the material
US3303400A (en) * 1961-07-25 1967-02-07 Fairchild Camera Instr Co Semiconductor device complex
US3441842A (en) * 1963-10-08 1969-04-29 Rudolph J Sturm Jr Line fault detection method and apparatus utilizing a test signal having a nonsinusoidal waveform preferably with at least one pip per cycle
US3274489A (en) * 1964-01-20 1966-09-20 Samuel H Behr Cable fault locator for ungrounded electrical systems including means for applying a square wave to the cable under test
US3621384A (en) * 1968-07-19 1971-11-16 Kazuo Yamada Apparatus for locating a short circuit in a dc wiring
DE1960103A1 (de) * 1969-11-29 1971-06-03 Volkswagenwerk Ag Verfahren zur Pruefung des elektrischen Durchganges von parallel geschalteten,in eine Scheibe eingebetteten Heizfaeden

Also Published As

Publication number Publication date
GB1419354A (en) 1975-12-31
DE2311903A1 (de) 1974-09-12
FR2220796B1 (en]) 1978-10-27
JPS50369A (en]) 1975-01-06
NL7402904A (en]) 1974-09-11
CH563587A5 (en]) 1975-06-30
IT1003688B (it) 1976-06-10
US3992663A (en) 1976-11-16
FR2220796A1 (en]) 1974-10-04
BE812056A (fr) 1974-07-01

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